Structural and Electrical Characterization of Heterostructures Suitable for Future Nanoscale CMOS Devices
University
Göteborgs universitet/University of Gothenburg
Institution
Physics and Engineering Physics
Fysik och teknisk fysik
Disputation
Hörsal KB Kemigården 4 Chalmers kl. 10.00
Date of defence
2004-12-16
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Date
2004Author
Myrberg, Tobias
Publication type
Doctoral thesis